Unjointed Test Finger for IEC 61032 Test Probe 11

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seat: Beijing
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Last update: 2017-12-21 15:56
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The Un-jointed/rigid Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be a hindrance. The UFP-01 meets IEC 60950 and 61010, CSA and UL requirements. This probe is precision made of flash chrome plated steel and the rest of the instrument of Delrin®. The handle can be threaded for use with our digital force gauges. All ED&D probes come with NIST traceable certificates of calibration. There is an additional fee for the data, and it must be ordered in advance. ED&D operates an ISO/IEC 17025 calibration lab. IEC61032-Probe 11-Figure 7

Meets Requirements for Testing Standard(s) including but not limited to:IEC 61010 EN 61010

Technical Parameter:

Test probe diameter: 12mm

Test probe length: 80mm

Baffle plate thickness: 5mm

Baffle plate diameter: 50mm
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