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Unjointed Test Finger for IEC 61032 Test Probe 11
2017-12-21 15:56  Visit:152
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Product Details The Un-jointed/rigid Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be a hindrance. The UFP-01 meets IEC 60950 and 61010, CSA and UL requirements. This probe is precision made of flash chrome plated steel and the rest of the instrument of Delrin®. The handle can be threaded for use with our digital force gauges. All ED&D probes come with NIST traceable certificates of calibration. There is an additional fee for the data, and it must be ordered in advance. ED&D operates an ISO/IEC 17025 calibration lab. IEC61032-Probe 11-Figure 7 Meets Requirements for Testing Standard(s) including but not limited to:IEC 61010 EN 61010 Technical Parameter: Test probe diameter: 12mm Test probe length: 80mm Baffle plate thickness: 5mm Baffle plate diameter: 50mm
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Company:Shenzhen Chuangxin Instruments Co., Ltd.
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Name:scicl598(Mr.)
Tel:86-755-23702758
Fax:86-755-61577693
Area:Beijing
Address:Gongle Fengheyuan, Xixiang town
Zip code:518021
Linkurl:http://scicl598.cztdgy.net/
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